Taliescent, based in Tucson, AZ USA, is a provider of calibration artifacts for fiber optic measurement verification. Our customers, in North America, Europe, and Asia, use these devices to improve their optical measurement integrity in R&D and production. In order to provide high-accuracy calibration artifacts, Taliescent has established relationships with major national standards labs and fiber optic test equipment manufacturers. Additional products and services include custom calibration artifacts and measurement integrity consulting. Please email us at sales@taliescent.com or call (815) 377-2413 for more information.
| The series PPLS PDL Calibration Artifact is a compact in-line device that possesses a fixed amount of polarization dependent loss (PDL). The nominal amount of PDL can be specified from 0.05 to 2.0 dB during ordering. Once the device is assembled, its PDL is measured using the Mueller Matrix method, according to the IEC-61300-3-12 specification and/or the All States method according to the TIA/EIA-455-157 standard. The PPLS features a sealed package and a low PDL temperature dependence. The primary application of the PPLS is its use as a calibration artifact when making PDL measurements. The flat wavelength PDL response, low temperature dependence, and the certification make this device the ideal choice for verifying the accuracy of PDL measurements. Additional applications include simulation of PDL in optical networks, and testing PMD compensators in the presence of PDL. The PPLS is available with FC/UPC and SC/UPC 1 meter long terminated pigtails. Other cable lengths and connector types are available with longer lead times. The PPLS is shipped with a calibration certificate (1 year expiration). | |
 | The series PMCA polarization mode dispersion (PMD) calibration artifact is a device that exhibits a fixed amount of PMD. The device consists of a section of polarization maintaining fiber (PMF), the PMD of which has been measured using the fixed analyzer method according to the TIA/EIA-455-113 standard. The measurement accuracy is verified by an artifact device that has been measured at and certified by the National Institute of Standards and Technology (NIST). As PMD becomes an increasingly critical distortion parameter in fiber optic telecommunications systems, it becomes more and more crucial to be able to accurately measure PMD in the optical fiber itself, systems, and components. A key method in producing accurate PMD measurements is to verify the measurement with an artifact device that has a known and well characterized PMD specification. The series PMCA has been designed precisely for this application. The series PMCA is available with the following nominal PMD values (0.35 ps, 0.70 ps, 1.4 ps, and 7 ps). Both FC and SC connector types are available. Please contact Taliescent for custom configurations or for more information on various PMD measurement methods.
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 | The series HVPLS high resolution variable polarization dependent loss source is a compact in-line device that possesses a varying amount of polarization dependent loss (PDL). A fine-adjust mechanism on the device enables high-resolution tuning of PDL. Two PDL ranges are available, 0.05 - 0.50 dB with the "L" option and 0.10 - 1.7 dB with the "H" option. With increasing complexity of next-generation optical networks, PDL becomes a major issue in the design and operation of these systems. This is due to the increased used of passive integrated components with high PDL specifications, and a greater bit error rate sensitivity to PDL for 10 Gbit/s and faster systems. It is therefore important to be able to measure, simulate, and, if necessary, compensate for large amounts of PDL in fiber optic links. The series HVPLS can be used to simulate PDL in fiber optic links and test the response of PMD compensators to variable PDL. Its large PDL range and high resolution make it the ideal solution testing next-generation optical networks. The HVPLS is available with a variety of options for the length and the type of termination of the fiber optic cables.
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 | The series RLCA return loss calibration artifact is a device that reflects an optical signal with a specified amount of loss. It is used for verifying the performance of return loss meters near the limit of their measurement range. As fiber optic components and assemblies become more ubiquitous in metro access and FTTH passive optical networks, return loss specifications have taken on more importance in the proper functioning of these netwroks. Verifying return loss measurements with artifacts is a key component of a rigorous quality control procedure. The series RLCA is available 15 dB and 25 dB nominal return loss values Both FC and SC angled connector types are available. Please contact Taliescent for custom configurations or for more information on reflection measurements.
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 | The series OTCA OTDR Calibration Artifact is a bench top instrument that exhibits loss and reflection properties that are normally encountered when making measurements with and Optical Time Domain Reflectometer. Its primary use is to verify the measurement accuracy and integrity of measurements made with an OTDR. As the rollout of FTTx installations gathers momentum, and newly built installations require certification, the use of OTDRs in these measurements increases commeasurably. It is crucial that OTDRs are making accurate measurements day in and day out, often in a harsh environment. The OTCA can serve as a verification tool to ensure that OTDRs are in proper condition between calibrations and after heavy use. In order to simulate different OTDR events commonly occurring in the field, the OTCA can be ordered in several variations. Different models are available to simulate fiber length and loss/km, a large attenuation that occurs when a 1XN splitter is in the measurement path, a “gainer” section that occurs when Dispersion Shifted Fiber (DSF) is in the path, or reflections that are present due to a improper splice or and unangled connector. The OTCA also features connections on both ends for bidirectional testing. The unit can also be ordered with a calibration certificate that is renewable after 1 year.
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 | The series HREF high resolution reflectometer standard is a device that contains two closely spaced optical reflections. It is used for verifying the performance of high resolution reflectometers at the limit of their measurement range. As fiber optic components and assemblies become more sophisticated in design and their physical features shrink, high resolution reflectometers become a key diagnostic tool in R&D and production. With the HREF standard, reflectometer users for the first time have a way to verify the accuracy of reflectometer measurements at very small spacings between reflections. The series HREF is available with the following nominal optical gap spacings (30 um, 100 um, and 200 um). Both FC and SC connector types are available. Please contact Taliescent for custom configurations or for more information on reflectometer measurements. |
